Volume 1, No. 2, 4th Quarter 1993
You've undoubtedly read the war of words in many of the favorite R&M periodicals over the last few years. Of all these words I think the ones that make the most sense are those of "MIL-HDBK-217 - A Favorite Target" (1993 Reliability and Maintainability Symposium paper) by Rome Laboratory's Seymour Morris and Jim Reilly. I know that you're probably thinking that I may be biased after working at RL for years; I say, read the paper and judge for yourself. Morris doesn't conclude that 217 is the complete answer and that "physics-of-failure" has no merit; but instead, he presents a detailed comparison of the two approaches including criteria such as the devices covered by each approach, the application cost, and the assumptions used. He concludes that each approach has its place because each attacks a different problem; the physics-of-failure approach addresses basic component design, while 217 addresses latent defects. I suggest that you keep an open mind on this issue and take the time to read the RAMS paper.
Preston R. MacDiarmid
Director
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