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Posted by: Guenther Kramm (guenther.kramm@philips.com )
Organization:Philips Medical Systems
Date posted: Tue Mar 16 8:00:54 US/Eastern 2004
Subject: Software reliability calculations in PRISM
Message:
Hello,
my question is about the software model input possibilities in PRISM. I have got all hardware components in the system which is a medical X-Ray generator with few assembly units and hundrets of parts in the units. The software model of PRISM takes into account the "normal" software which we call the application software of our generator. Here I can do the calculation with Line of code, fault density etc. but how can I do reliability analysis for software in DSPs or FPGAs. E.g. for the DSPs it is about 90kb code in assembler what does it mean in line of code, how can I translate these data.

Replies:
Software reliability calculations in PRISM
David Dylis Thu Mar 25 16:03:54 US/Eastern 2004

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Posted by: Thomas Urbanczyk (thomas.urbanczyk@systema-gmbh.de )
Organization:SystemA Engineering GmbH
Date posted: Wed Mar 10 4:13:16 US/Eastern 2004
Subject: Prism Export to Excel - Import
Message:
Problem:
I've got a big assembly with lots of sub-assemblys (about 130 sub-assemblys, 800 parts in total). Now I have to change a value for most of the parts, which could be done easily with excel. Therefore I used the export function, in the next step I imported the file to excel and changed the relevant values. Problem is, the import back to PRISM doesn't work, or better said, I have to manually build up the assembly structure again. Is there any way to do it correctly?

Replies:
Importing with PRISM
Tammy Sehn Fri Mar 12 11:24:44 US/Eastern 2004

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Posted by: Anuradha (pa.anuradha@tbg.tvse.co.in )
Organization:TVS Electronics
Date posted: Tue Jul 22 11:05:39 US/Eastern 2003
Subject: PRISM component reliability prediction
Message:
I had installed demo version of PRISM,I want to predict the reliability of a transistor.Even though the case temperature measurement of the device says TJ 85 degree as against 150 degree, i am subjecting the Voltage stress greater than 100%.
VCE stress is disabled in the demo software. Will it be disabled in the Purchased software also (or) will it be enabled?

Replies:
Collector to Emitter Voltage (VCE)
David Dylis Wed Jul 23 7:03:03 US/Eastern 2003

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Posted by: Barry Ives (barry.ives@lmco.com )
Organization:Lockheed Martin Systems Integration-Owego
Date posted: Tue Dec 10 12:33:27 US/Eastern 2002
Subject: Failure per Million Hours
Message:
Please explain how the failure rate per million hours increases as the duty cycle is decreased (when I divide by the duty cycle to convert from failures per million calendar hours). This seems to defy logic as I would expect the failure rate per million hours to decrease as I decrease the percentage of operating time.

Replies:
PRISM Field and Predicted Comparison
David Dylis Tue Dec 10 13:23:10 US/Eastern 2002

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Posted by: Patricia (patricia.simon@quantum.com )
Organization:Quantum
Date posted: Tue Dec 3 16:03:58 US/Eastern 2002
Subject: IC Failure Rate Changes due to Temp Rise
Message:
Hi,
I noticed that if I add a value for temperature rise to a linear IC, the failure rate decreases. If a component adds heat to a system, shouldn't the failure rate increase??? Your help in answering this question is greatly appreciated! Thank you, Patty

Replies:
IC Failure Rate Changes due to Temp Rise
David Dylis Tue Dec 3 17:33:27 US/Eastern 2002

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