Forum: Reliability & Maintainability Questions and Answers
Posted by: Julien NICO (ARZ_ST_ELB@compuserve.com ) Organization:Aérazur, Zodiac Group, FRANCE Date posted: Fri Apr 9 5:38:28 US/Eastern 1999 Subject: MTBF in different environment Message: Most of component MTBF that I get for my suppliers are expressed for aircraft application. I am working also on Helicopter application and I would like to convert MTBF that I already have by using a correct conversion factor. In spring 1993 RAC newsletter, this question has been asked. Unfortunately, I don't have this newsletter and I can't find it on the RAC web site. If someone can send me all correction factors, I will really appreciate. Many thanks for your help.
Posted by: Ananda Perera (Ananda.Perera@alliedsignal.com ) Organization:AlliedSignal Aerospace Canada Date posted: Thu Apr 8 8:34:17 US/Eastern 1999 Subject: Microcircuit Quality Factors for Custom Screening Message: MIL-HDBK-217F, Notice 2; Section 5.10 - Microcircuits Quality Factors Reference Page 5-16: In the Quality Factor calculation for Custom Screening Programs, MIL-STD-883 Tests for Group 1 & Group 2 are the same. However (1) Point Valuation for Group 1 is 50; (2) Point Valuation for Group 2 is 37 ????? How can both Groups having same tests have different Point Valuations and hence different Quality Factors ?????
Posted by: Christine Sims (sims@azstarnet.com ) Organization:HE Microwave Date posted: Fri Apr 2 13:11:40 US/Eastern 1999 Subject: Accelerated Step Stress Testing Models Message: I am working on a research project and am looking for information about Accelerated Step Stress Testing Models. Is this type of testing the same as HALT testing? Any information would be greatly appreciated.
Posted by: Clay Davis Date posted: Fri Mar 19 18:31:09 US/Eastern 1999 Subject: MTBF Demonstration Message: What are some alternate ways to demonstrate MTBF on computer boards and systems? The traditional method is to run the boards/systems for a certain amount of hours and divide by the failures. I am looking at different methods (say ESS / HALT) that could you extrapolate MTBF from.
Posted by: Ananda Perera (Ananda.Perera@alliedsignal.com ) Organization:AlliedSignal Aerospace Canada Date posted: Fri Mar 19 15:39:03 US/Eastern 1999 Subject: Defect Density & Quality Factor Message: If an Electronic Component is exhibiting a Defect Density of 750 ppm, what could be the Quality Factor for (a) Semiconductor (JAN or JANTX or JANTXV or What Else); (b) Microcircuit (Class B-1 or B or S or What Else) This information is for predicting a failure rate of an electronic component using MIL-HDBK-217
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