Forum: Reliability & Maintainability Questions and Answers
Posted by: Izzy Miller (izzy.miller@ngc.com ) Organization:NGC Date posted: Fri Mar 4 9:10:24 US/Eastern 2005 Subject: Year of Manufacture in RELX PRISM Model Message: RELEX allows for a prediction parameter for the "Year of Manufacture" when using PRISM. Is this the actual year that the specific device and Lot were manufactured or the year that the device first came into being manufactured. The default is the present year (2005. RELEX only allows one year to be entered though the PIg in PRISM is an exponential function of both the year of manucture and the base year of manufacture. Any help would be appreciated.
Posted by: Rushabh J (rushabh.jariwala@gmail.com ) Date posted: Wed Mar 2 6:47:25 US/Eastern 2005 Subject: Accelerated testing Book Message: If anyone knows any good book on Accelerated testing then please suggest. Basically I want to understand how to isolate failure mode, mechanisms and then apply accelerated testing with allowable margins.
Posted by: Jean-Marie Cloarec (jmcloarec@thsrc.com.tw ) Organization:IREG Date posted: Wed May 18 12:52:34 US/Eastern 2005 Subject: Railway SILs Seminar Message: Hello, IEE organised a seminar on SIL (Safety Integrity Level) in 2002 and I am desperately trying to get copy of the papers published during this seminar. Is there someone that could send me a soft copy ? Thank you
Posted by: Glen Hanington (ghanington@elgar.com ) Organization:Elgar Electronics Corp. Date posted: Thu Feb 17 14:00:36 US/Eastern 2005 Subject: Accelerated Life Testing Message: I am looking to prove a 50,000 hour MTBF for a power supply design in as short a time and most cost effective way possible. The product is rated to 50degC. Each one is large and bulky, and costs several thousand dollars to produce, so having a large quantity of units on an accelerated life test at constant temperature would be prohibitive in both cost and temperature chamber availability. I would like to be able to increase my rate of failure precipitation by employing both input power and temperature cycling. While I understand that the Arrhenius equation can only be used to accomodate a single constant acceleration factor, has anyone ever been able to justify this approach to speed up the process? What would be required in order to justify this technique? How does it affect confidence level determination? What would be your recommendation?
Posted by: Roman (rkatchmar@med-eng.com ) Organization:Med-Eng Date posted: Wed Feb 16 16:29:55 US/Eastern 2005 Subject: ESS Strategies Message: I am trying to identify the most current or relevant miltary requirements or guidelines regarding ESS. I frequently see much reference to Mil Hdbk 344A, but also find Mil Hdbk 2164A a bit more prescriptive than the former for what has generally been a non-prescriptive burn-in test problem. Nowhere can I find reference to use of HAST/HASS as feeder info to ESS as often done in the commercial world. All thoughts welcome.
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