Forum: Reliability & Maintainability Questions and Answers
Posted by: IC Date posted: Mon Mar 5 16:07:21 US/Eastern 2007 Subject: Reliability Apportionment Message: I am looking for information in relation to apportionment and the techniques used for calculating it. I have calculated the apportionment for a System with 6 sub-systems (Using the Equal Apportionment Technique from MIL-HDBK-338). NOW I am trying to calculate the apportionment for the sub systems with the new information that each sub system has now been "weighted" (i.e sub sys 1 will be responsible for 20% fo all system failures and Sub sys 2 47% etc etc). Can anybody tell me how I will calculate the new reliability apportionment based on the "weighted" factors or let me know of any techniques/equations that I can use.
Posted by: Rushabh Date posted: Mon Mar 5 16:06:00 US/Eastern 2007 Subject: How to test Long Term Drift (Electroncis Assembly) Message: Let me first explain the electronics product. It is similar to pressure transmitter which measures the product and send the data in digital form. The product is using microcontroller based architecture to filter out data and to process the data.
To define the test I first looked at semiconductor component level drift test. What I found out is output parameter drift is measure for constant input parameter for typical 1000 hrs and it is projected as drift. Some papers provides a justification on this technique by assuming that chip material stabilize within 1000 hrs so there won’t be major drift expected after 1000 hrs. I believe this method is valid for semiconductor so bit reluctant on applying it to electronics assembly. “ EXPERT SUGGESTION REQUESTED ON APPLICABILITY OF THIS TECHNIQUE TO ELECTRONICS ASSEMBLY” If anyone can help to identify the standard or industry known technique to measure long term / short term drift of electronics assembly then it would be great. Major Challenges : 1 ) Share any standard/guideline info. to measure long term drift of electronics assembly 2 ) What should be test time in this type of test ? 3 ) What should be input parameter pattern CONSTANT / VARYING ?? 4 ) Is there anyway test time can be squeezed by elevating test temperature ?? Any more inputs required to answer this please revert back.
Thanking You in anticipation,
Rushabh
Posted by: Richard Date posted: Mon Mar 5 16:03:11 US/Eastern 2007 Subject: General Aviation Aircraft - Vibration Profile Message: Does anybody know of an information link that would illustrate a vibration profile for a general aviation aircraft (e.g. Cessna/Piper etc.). I am specifically looking for something to show the g and deflection etc. in each of the 3 axes to help with circuit card orientation etc. Thanks in advance.
Posted by: GRIB Date posted: Mon Mar 5 16:02:07 US/Eastern 2007 Subject: Conversion factor between OH/FH Message: The average flight time for an aircraft is 1.75 hrs. the conversion factor between operating hrs and flight hrs OH/FH is 1.24. According to the above information, shall I multiply each failure rate issued from the NPRD per 1.24 in order to obtain the total failure or the MTBF per Flight hours?
Posted by: Sue Hedrick Date posted: Mon Mar 5 16:01:08 US/Eastern 2007 Subject: Resistor Calculation Message: With regard to resistor calculations, how can I determine theta EC. I had thought that it was calculated using (storage temp - max operating temp) / resistor power rating. This gives me huge numbers, greater than 600 deg C / W. What should I be doing?
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