Forum: Reliability & Maintainability Questions and Answers
Posted by: Mohammad Eyadat (meyadat@soma.csudh.edu ) Organization:CSUDH Date posted: Mon Nov 13 20:31:07 US/Eastern 2000 Subject: Failure data needed Message: I am currently working on a research project to enhance the software reliability models. Test data are urgently needed. The data should meet the following criteria. 1. They are collected from testing computer software programs. 2. Data are recorded as the (execution) times between two consecutive failures over a specified period of time. Anyone has information leading me to the data sets?
Posted by: Klaus Denkmayr (k.denkmayr@sat.steyr.com ) Organization:ZF STEYR Date posted: Thu Nov 9 5:59:26 US/Eastern 2000 Subject: pressure - lifetime relationship Message: A variable displacement pump is one of the key subsystems of our new automatic transmission. We have to define an accelerated test procedure to estimate the lifetime of the pump. Where can I find a relation between pressure and lifetime for a pump? Thanks in advance, Klaus
Posted by: Juan C. Rodenas (info@einsa.es ) Organization:EINSA Date posted: Tue Oct 31 4:00:34 US/Eastern 2000 Subject: Relex vs PRISM Message: I am trying to adquire a reliability software for my company. I have notice of two different programs for this Prism and Relex(reliability package). The differences in prices are significant but I do not find big differences. Does somebody on the forum have experience in both of them of have identified any important differences? Thank you in advance.
Posted by: Paul Cottrell (paul.cottrell@bae.co.uk ) Date posted: Mon Oct 30 5:53:24 US/Eastern 2000 Subject: Reliability Data for Motorola MVEME2400 Power PC boards Message: Has anybody any "field data" for the Motorola MVME2400 Power Pc Boards.
Posted by: Keith Chinchar (chinc_k@tdipower.com ) Date posted: Wed Oct 25 14:09:32 US/Eastern 2000 Subject: Endurance versus HALT Message: I'm performing HALT tests to demonstrate MTBF for electronic assemblies (power supplies in particular). I understand the application of the various acceleration models (Arrhenius, Peck, Kemeny, Lawson, etc.) for adding the stresses of temperature, humidity and voltage (et. all)to obtain an acceleration factor. However, I've run into a situation that adds the stress of cycling a unit on and off (demonstrating a duty cycle) during the duration of the test. I realize that this will cause a thermal cycling effect on the multitude of failure mechanisms within my device. I'm planning to run my test at an elevated temperature and apply the Arrhenius model to obtain an acceleration factor. How do I estimate an acceleration factor that takes into account the duty cycle (it would need to consider the duty cycle and the total number of cycles over the life expectancy of the product)? Will the Coffin-Manson relationship / inverse power law apply here? Any help is appreciated. Thanks in advance
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