Forum: Reliability & Maintainability Questions and Answers
Posted by: Juan Moreno (jhermo@inf.upv.es ) Organization:University of Valencia Date posted: Wed Jun 7 10:42:04 US/Eastern 2000 Subject: Generic Failure Rate Tables Message: For Bellcore Issue 6, generic failure rate tables haven't enough categories and subcategories to classify many devices used frequently, where can I find more detailed tables? Thanks
Posted by: Narendra Nath K S (ksnaren@cedt.iisc.ernet.in ) Organization:CEDT, IISc Date posted: Wed Jun 7 2:06:30 US/Eastern 2000 Subject: Markov Method Message: Hello All, I am looking for "Automation of reliability analysis using Markov Method". I'll be grateful if anybody can provide me asistance for the above Thanx in advance --Naren
Posted by: D. Gordon (info@reliability.com ) Organization:Reliability Center, Inc. Date posted: Tue Jun 6 16:03:53 US/Eastern 2000 Subject: MEAD Test Message: I am trying to find some information for a client. He is asking to find the reliability and validity of the MEAP test. Does anyone know where I can find any information on this? Thank you for your time!
Posted by: Chetan Bhatt (bbchetan@cedt.iisc.ernet.in ) Organization:Center for Electronics Design & Technolgy Date posted: Mon Jun 5 11:49:58 US/Eastern 2000 Subject: Software reliability versus hardware reliability Message: I want to know about the difference in Software reliability and hardware reliability modelling, prediction it application at different development stage.
Posted by: Johnson Wood (7815@notesmail.huawei.com.cn ) Organization:Shenzhen Huawei.Tech.Co.,Ltd. Date posted: Mon Jun 5 3:25:40 US/Eastern 2000 Subject: Reliability Data Source Message: There are two kinds of data source for component failure rates.One is 217 or other reliability prediction manual, another is the manufacturers' data. But I think they're quite different. The data in 217 are generated by statistics of field operation information.But failure rates provided by manufacturers are generally derived from reliability tests. During these tests, the components are not in an operating condition. So these data can not represent the components' reliability in operating condition. Am I right?
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