Forum: Reliability & Maintainability Questions and Answers
Posted by: Julien Nico (jnico@zodiac-group.com ) Organization:Aérazur - Zodiac group Date posted: Mon Mar 27 10:56:52 US/Eastern 2000 Subject: Reliability for a missile equipment Message: We are currently designing a fuel cell for a missile (fuel cell made with rubber). The missile shall be store during 20 years then launched. Our fuel cell is filled of fuel at the begining. The missile can be subject to underwing carried flights and be launched after 20 years. Time during launched phase is 10 minutes. I have to define the MTBF for the fuel cell. I don't know how to express the MTBF for the component. I can express a MTBF for the 10 operationals minutes but I don't know how to take into account the storage period. Is there a reliability means to express the storage period in the final calculation (fuel cell properties can changed during storage period).
Posted by: Jean Marie Cloarec (Jean-Marie.cloarec@ligeron.com ) Date posted: Thu Mar 23 12:23:13 US/Eastern 2000 Subject: Reliability data Message: I'm searching reliability information about optical components : lens, mirror, .... failure mode and failure data. If you websites or if you have some informations .... thank you
Posted by: Bob Valerius (robert_m_valerius@md.northgrum.com ) Organization:Northrop-Grumman Oceanic Systems Date posted: Wed Mar 15 9:25:07 US/Eastern 2000 Subject: reliability of crimp vs. solder type connections Message: Does anyone have any data on the reliability of crimp vs. solder type connections that is NOT from 217F? Thanks in advance.
Posted by: Clay Davis Date posted: Fri Mar 10 13:53:16 US/Eastern 2000 Subject: System Availability Message: Can anyone tell me of any good reference material on how to design and calculate availability (esp for a computer server)? Thank you.
Posted by: Henry Davis (henry.davis@das.honeywell.com ) Organization:Honeywell DAS Date posted: Tue Mar 7 15:46:55 US/Eastern 2000 Subject: Failure rate for mosfets Message: There was a previous question regarding failure rate models for MOSFETs. Does the prism tool support this now? I was unable to tell from a download of the sample. Is it necessary to purchase the prism tool to develop the failure rate for industrial temp range MOSFETs? What have others done when working with MOSFETs? Thanks
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