Forum: Reliability & Maintainability Questions and Answers

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Posted by: Julien NICO (ARZ_ST_ELB@compuserve.com )
Organization:Aérazur, Zodiac Group, FRANCE
Date posted: Fri Apr 9 5:38:28 US/Eastern 1999
Subject: MTBF in different environment
Message:
Most of component MTBF that I get for my suppliers are expressed for aircraft application. I am working also on Helicopter application and I would like to convert MTBF that I already have by using a correct conversion factor.
In spring 1993 RAC newsletter, this question has been asked. Unfortunately, I don't have this newsletter and I can't find it on the RAC web site. If someone can send me all correction factors, I will really appreciate. Many thanks for your help.

Replies:
Conversion Factors
Bruce Dudley Wed Apr 14 10:21:47 US/Eastern 1999

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Posted by: Ananda Perera (Ananda.Perera@alliedsignal.com )
Organization:AlliedSignal Aerospace Canada
Date posted: Thu Apr 8 8:34:17 US/Eastern 1999
Subject: Microcircuit Quality Factors for Custom Screening
Message:
MIL-HDBK-217F, Notice 2; Section 5.10 - Microcircuits
Quality Factors Reference Page 5-16: In the Quality Factor calculation for Custom Screening Programs, MIL-STD-883 Tests for Group 1 & Group 2 are the same. However (1) Point Valuation for Group 1 is 50; (2) Point Valuation for Group 2 is 37 ????? How can both Groups having same tests have different Point Valuations and hence different Quality Factors ?????

Replies:
Microcircuit Quality Factors for Custom Screening
Ananda Perera Sat Apr 10 20:11:59 US/Eastern 1999

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Posted by: Christine Sims (sims@azstarnet.com )
Organization:HE Microwave
Date posted: Fri Apr 2 13:11:40 US/Eastern 1999
Subject: Accelerated Step Stress Testing Models
Message:
I am working on a research project and am looking for information about Accelerated Step Stress Testing Models. Is this type of testing the same as HALT testing? Any information would be greatly appreciated.

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Accelerated Step Stress Test
Bruce Dudley Mon Apr 5 10:38:20 US/Eastern 1999

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Posted by: Clay Davis
Date posted: Fri Mar 19 18:31:09 US/Eastern 1999
Subject: MTBF Demonstration
Message:
What are some alternate ways to demonstrate MTBF on computer boards and systems? The traditional method is to run the boards/systems for a certain amount of hours and divide by the failures. I am looking at different methods (say ESS / HALT) that could you extrapolate MTBF from.

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Alternate Testing Methods
Bruce Dudley Mon Apr 5 10:56:22 US/Eastern 1999

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Posted by: Ananda Perera (Ananda.Perera@alliedsignal.com )
Organization:AlliedSignal Aerospace Canada
Date posted: Fri Mar 19 15:39:03 US/Eastern 1999
Subject: Defect Density & Quality Factor
Message:
If an Electronic Component is exhibiting a Defect Density of 750 ppm, what could be the Quality Factor for (a) Semiconductor (JAN or JANTX or JANTXV or What Else); (b) Microcircuit (Class B-1 or B or S or What Else)
This information is for predicting a failure rate of an electronic component using MIL-HDBK-217

Replies:
Defect Quality Factor
Bruce Dudley Mon Apr 5 11:07:57 US/Eastern 1999

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