Forum: Reliability & Maintainability Questions and Answers
Posted by: Charles Schornak (charles.l.schornak@boeing.com ) Organization:The Boeing Company Date posted: Tue Feb 2 17:49:51 US/Eastern 1999 Subject: MIL-HDBK-217 Prediction Models Message: The front section 4 of MIL-HDBK-217 identifies the limitations of the reliability prediction models: "... none of the models in this handbook predict nuclear survivability or the effects of ionizing radiation." I am interested in any information pertaining to prediction models for resistors, capacitors, and diodes that are used in an ionized gas environment created by nucleating particles.
Posted by: Don Lin (dllin@lucent.com ) Date posted: Wed Jan 27 9:26:07 US/Eastern 1999 Subject: Survey of companies doing TAAF Message: Criscimagna and Zsak wrote an article "Reliability Growth" in the "Jour of RAC" (3rd Quarter 1998). It is similar to the use of the Test-Analysis-And-Fix (TAAF)approach (http://www.bmpcoe.org/how-to/books/taaf/intro.html) to increase the reliability of products. This approach was adopted by Army, Navy, and Air Force. Do you know any companies implementing this approach? Any companies use it for non-military, commercial products?
Posted by: XiaoBoJiang (xbjiang@263.net ) Date posted: Mon Jan 25 2:42:02 US/Eastern 1999 Subject: FPA Assembly Message: My work is related with reliability of focal plane arrays assembly. Do anyone know how to evaluate the reliability of the FPA assembly.
Posted by: Mark Urban (murban@sdlcomm.com ) Organization:SDL Communications Date posted: Thu Jan 21 13:57:05 US/Eastern 1999 Subject: Burn-in Message: Does burn in today buy you anything? We currently perform a static burn in with after burn test defects around 0.001%. Dynamic burn in has been suggested. What about HALT testing on prototypes and eliminating burn in on production lots. Any input would be much appreciated. Thanks, Mark
Posted by: Bert Moore (anubis98@hotmail.com ) Date posted: Tue Jan 19 15:12:36 US/Eastern 1999 Subject: Nonelectronic Failure Rates Message: I'm looking for a very good source to obtain nonelectronic failure rates.
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