Forum: Reliability & Maintainability Questions and Answers
Posted by: Durga Rao (durga_k_rao@yahoo.com ) Organization:BARC Date posted: Sat Dec 4 5:45:38 US/Eastern 2004 Subject: reliability Message: For predicting reliability of electronic equipment using mil-hdbk-217f(2), failure modes and their contribution is not specified. How to account for failure modes with this data bank. Can anybody please kindly clarify.
Posted by: Bob Valerius (robert.valerius@ngc.com ) Organization:Northrop-Grumman Oceanic Systems Date posted: Fri Dec 3 15:12:25 US/Eastern 2004 Subject: Relibility of Drive Belts Message: Hi. Does anyone know of a reliability model for drive belts? I realize they are listed in NPRD-95 but am hoping for a model that can predict life with stress parameters. Thanks!
Posted by: John Cloarec (jmcloarec@thsrc.com.tw ) Organization:IREG Date posted: Thu Dec 2 3:42:34 US/Eastern 2004 Subject: Website accessibility Message: Journal of RAC, 3rd quarter : the website for new DoD Supportability Guidebook (page 23) is wrong. Cannot be open. Have you another address? Thank John PS: try to send a message by "Contact Us" but when I put Taiwan, it's impossible, there is a bug in your form
Posted by: Patrick Kidwell (pkidwell@teleinc.com ) Organization:Tele-Consultants, Inc. Date posted: Tue Nov 23 13:18:43 US/Eastern 2004 Subject: Naval Unsheltered Environment Message: In performing the reliability prediction for a Navy SATCOM program the question of what opeating enviornment should be used for an antenna that is housed inside a radome is in question. The radome does not provide any protection for temperature, but does appear to provide some protection from solar radiation (less heat), rain, salt spray, etc. In the Reliability Toolkit, Table A11-2 GF can be converted to NU by multiplying the value by 0.3. Is there another factor that can be used for partial protection from the environment to cover this design application?
Posted by: Olga G (olgy@hotmail.co.il ) Organization:IDF Date posted: Wed Nov 17 17:05:29 US/Eastern 2004 Subject: residual component life after environmental testing Message: I would like to know if it is possible for Electronic components, after Environmental Testing, to be used as "usual" or are there any restrictions as to their residual life? Is there any change in the failure rate as a consequense of these tests?
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