Forum: Reliability & Maintainability Questions and Answers

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Posted by: Tom
Date posted: Mon Mar 5 16:17:46 US/Eastern 2007
Subject: B Life Formula
Message:
This formula was provided as a method for calculating B life as a function of the number of failures and test time. I am not quite sure of its derivation. Any thoughts would be appreciated. Thanks.


BLIFE = SQRT (∑(accel hr)2 (ln ( 1/reliability)) / chi-Square (1 desired confidence), (2n + 2))

n = number of failure.

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Posted by: Erica
Date posted: Mon Mar 5 16:13:47 US/Eastern 2007
Subject: SEU/MBU Probability Evaluation
Message:
We need to evaluate the probability of occurrence of SEU/MBU effects in the our chip (memories, registers, state machines)on aircraft environment. In particular we know if there is a formula that allows to calculate this probability and what type of parameters we need to know. Is there a connection between a SEU and MBU occurrence probability (in upset/bit/hour) and the Average Atmospheric Flux that the aircraft is exposed? What type of relation? Thank you in advance.

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Upset Events
B. W. Dudley Fri Mar 9 13:23:08 US/Eastern 2007

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Posted by: Richard
Date posted: Mon Mar 5 16:12:36 US/Eastern 2007
Subject: Communications Cable Reliability
Message:
I am trying to develop a reliability test for a communications cable. The cable uses stranded wires, some of which are twisted pair and is approx 2 feet long and is installed within a piece of electronic equipment.


Aside from installing a cable in the top level assembly and testing it under vibration etc. does anybody know of a stand-alone test for a cable to qualitatively assess it's reliability and to perhaps compare it with different designs of the cable ? (i.e. create a measuring stick to determine improvements etc.)

Thanks in advance.

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Cable Testing
bwd Tue Mar 6 5:59:49 US/Eastern 2007

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Posted by: Shanta
Date posted: Mon Mar 5 16:10:29 US/Eastern 2007
Subject: Reliability of Friction lock connectors vs. Positive mating connectors
Message:
Does anybody have information/data on the reliability of friction lock connectors vs. reliability of positive mating MTA connectors? Is one more reliable than the other? In what type of applications would you prefer to use one over the other?


Thanks for the help in advance.

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Posted by: Glen Hanington
Date posted: Mon Mar 5 16:09:14 US/Eastern 2007
Subject: Chip Cap reliability
Message:
Where can I find reliability information on chip cap failure rates versus volumetric efficiency? I've often heard that the failure rate for chip caps that are at their highest capacitance value for a given package size is typically higher than those that have some "margin." Has anyone done this type of a study? Factors could include dielectric material, voltage rating, package size, manufacturer, etc.
Any suggestions?

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