Forum: Reliability & Maintainability Questions and Answers

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Posted by: Sheila Prather (sheila_s_prather@mail.northgrum.com )
Organization:Northrop Grumman Corporation
Date posted: Thu Jul 18 10:07:52 US/Eastern 2002
Subject: Silicon Carbide Transistor Reliability Data or Modeling
Message:
Do you have any information from vendors regarding actual silicon carbide transistor reliability (from a collective standpoint) and/or prediction models for this technology? Thanks..

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Posted by: Lim (limth@cet.st.com.sg )
Date posted: Thu Jul 18 3:54:01 US/Eastern 2002
Subject: ESS for Fine Pitch SMT components
Message:
Hi,
My company is currently using fine pitch SMT components in one of our products. We practise ESS whereby we subject products to Random vibration of 20-1000Hz with a Grms of about 6g. However, because of these fine pitch components used, we are concerned that the mentioned vibration profile will damage the product. Does anyone have any experience in this area whcih they can advise. Is there any specific profile to use? Tks.

Replies: (list all replies)
ESS Vib on SMT
Joe Dzekevich Fri Jul 19 8:37:57 US/Eastern 2002
ESS for Fine Pitch SMT components
Lim Wed Jul 31 1:06:03 US/Eastern 2002
ESS for Fine Pitch SMT
Andre Kleyner Mon Aug 5 10:29:09 US/Eastern 2002

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Posted by: Tom Clark (tclark@sanera.net )
Date posted: Thu Jul 11 14:46:20 US/Eastern 2002
Subject: RAC FIT Rates
Message:
We have received some test reports from a DC-DC converter vendor. They show an MTBF of 3547773 hours with a total failure rate for the assembly of .281867 The reports are labeled with PRISM v1.3 and RAC. The standard for FIT rate is failures in 10^9 hours, however the failure rate here only makes sense if it is out of 10^6 hours. Does RAC do things differently, or is there some other explanation for this dioscrepancy?
Thanks!

Replies:
PRISM failure rate
B.W.Dudley Thu Jul 11 14:11:18 US/Eastern 2002

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Posted by: Tom Clark (tclark@sanera.net )
Date posted: Thu Jul 11 14:51:47 US/Eastern 2002
Subject: Backplane Reliability Models?
Message:
I would like to know standard techniques used to model the reliability of a backplane. Since a backplane is not easily replaced, the MTTR is high. This means the FIT rate must be extremely low in order to show a reliable system may be built with that backplane. However, using the SR-332 standard 0.2 FITs per pin, a backplane with many high density connectors can quickly accrue FITs. The connectors I am using are rated for 200 matings. It seems unlikely that they will encounter more than 20 matings in the life/mission of the product. Can I use this information to change how I model the backplane?
From looking at data shared by other companies, there is clearly a standard way to derate the FITs to show the backplane is ultra reliable (as it should be).....

Replies:
Connector Pin Failure Rate
B. W. Dudley Thu Jul 25 13:44:35 US/Eastern 2002

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Posted by: LEE (DEVILHOSEUNG@HOTMAIL.COM )
Organization:GA TECH
Date posted: Tue Jul 9 15:39:34 US/Eastern 2002
Subject: HUMAN RELIABLITY MODELING
Message:
I NEED SOME INFORMATION ABOUT SOFTWARE RELATED TO THE HUMAN-MACHINE RELIABILITY. SPECIALY IT SHOULD BE AVAIBLE FOR AIRCRAFT SAFETY BY DESIGN OR AEROSPACE ENGINEERING DESIGN. IF YOU KNOW ANY INFORMATON, PLEASE LET ME KNOW. THANKS.

Replies:
Human Reliability Modeling
Nathan Holzhauer Mon Jul 22 10:27:24 US/Eastern 2002

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