Forum: Reliability & Maintainability Questions and Answers
Posted by: Sheila Prather (sheila_s_prather@mail.northgrum.com ) Organization:Northrop Grumman Corp Date posted: Fri Oct 26 12:54:29 US/Eastern 2001 Subject: MIL-HDBK-344A - ESS for Electronic Equipment Message: Mil-hdbk-344A references parametric vs. functional testing? What are the differences in the two?
Posted by: Jon Ilseng Date posted: Thu Oct 25 12:37:28 US/Eastern 2001 Subject: Gate Count for TI Digital Signal Processor IC (TMS320C542PGE2-40) Message: Does anybody know the gate count for a Texas Instruments Digital Signal Processor IC, Part No. TMS320C542PGE2-40
Posted by: Jean-Marie CLOAREC (Jean-Marie.Cloarec@ligeron.com ) Organization:LIGERON SA Date posted: Thu Oct 25 9:08:02 US/Eastern 2001 Subject: Safety Case Message: Can anybody explain me what really means "safety claims" in a Safety Case Report as specified in Def Stan 00-56 ?
Posted by: Cloarec (Jean-Marie.Cloarec@ligeron.com ) Organization:LIGERON SA Date posted: Mon Oct 22 11:53:04 US/Eastern 2001 Subject: Safety Case Message: I'm searching the following document : Support for Safety CAse Argument using SAM, Reliability Engineering and Safety Systems, vol 43, n°2, pp 111-127, 1994, from JA McDermid.
Posted by: Sheila Prather (sheila_s_prather@mail.northgrum.com ) Organization:Northrop Grumman Corporation Date posted: Wed Oct 17 8:27:10 US/Eastern 2001 Subject: Butt Joints Re J-STD-001B Message: J-STD-001B disallows use of butt joints for Class 3 equipment but does not clarify allowed usage for product development phases. One would assume that this would be disallowed for production hardware, but is there any historical data which would support use of this technique for hardware built during a design and development(EMD) phase of a program?
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