Forum: Reliability & Maintainability Questions and Answers

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Posted by: Diane Gordon (info@reliability.com )
Organization:Reliability Center, Inc.
Date posted: Tue Aug 28 10:16:41 US/Eastern 2001
Subject: Data to Test Condition Based Maintenance Algorithms
Message:
Where can I find data to test condition based maintenance algorithms? It could be any field and related to any industry. Thank you!

Replies:
Condition Monitoring
B.W. Dudley Thu Sep 6 14:40:22 US/Eastern 2001

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Posted by: Gregory L. Rose (glrose@home.com )
Organization:NASA/Goddard Space Flight Center
Date posted: Fri Aug 24 20:18:17 US/Eastern 2001
Subject: Plastic Encapsulated Microcircuits and Semiconductors
Message:
I am trying to obtain a copy of a document produced by EIA/G12 called "SSB-1, Guidelines for using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and other rugged applications". Can anybody provide guidance about getting a free copy? I have tried JEDEC and RAC, no luck.

Replies:
PEM & Semiconductors Applications
William H. Crowell Sat Aug 25 4:55:26 US/Eastern 2001

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Posted by: Johnson Wood (wuxiangping@huawei.com )
Organization:Huawei Tech.Ltd.,Co.
Date posted: Tue Aug 14 3:55:01 US/Eastern 2001
Subject: Weibull
Message:
The circuit boards burn-in datas are recorded per month, judy as follows:
Date Sample Size #Failed 2001-2 1494 34 2001-4 3494 144 2001-5 25902 702 2001-6 20082 682 Which method of Weibull is suitable for this type of data?

Replies: (list all replies)
Weibull Data
Joe Dzekevich Tue Aug 14 16:28:06 US/Eastern 2001
Weibull
Johnson Wood Tue Aug 14 21:54:16 US/Eastern 2001
Infant Mortality / Weibull
Joe Dzekevich Thu Aug 16 9:33:47 US/Eastern 2001
Weibull reliability estimates from burn-in data
Larry George Tue Aug 21 15:12:39 US/Eastern 2001

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Posted by: Paul Cottrell (paul.cottrell@baesystems.com )
Organization:BAe Systems
Date posted: Mon Aug 13 11:08:06 US/Eastern 2001
Subject: Long Term reliability Effects of "no clean" flux.
Message:
I have discovered that certain assemblies being used in a system we are designing contain "no-clean" flux. Do you have any information on the long term reliability effects of this type of flux. The items in our system containing this type of flux cannot be cleaned (for reasins I am not too sure about). The environment the items will be used in is a naval sheltered one.

Replies:
Long Term reliability Effects of "no clean" flux
Gary Sunada Wed Aug 15 10:51:42 US/Eastern 2001

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Posted by: Lanny Gerber (c.lanny.gerber@l-3com.com )
Organization:L-3 Communications
Date posted: Wed Aug 8 11:13:07 US/Eastern 2001
Subject: MSBF
Message:
How is Mean Swaps Between failure calculated ? This seems to be the new marketing term.

Replies: (list all replies)
Re: MSBF
Richard Smith Wed Aug 8 13:03:22 US/Eastern 2001
MSBF (mean swaps between failure)
B.W.Dudley Wed Aug 8 15:00:13 US/Eastern 2001

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