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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Ken Burgess (burgessfk@gvl.esys.com )
Organization:Raytheon Acft Integration Systems
Date posted: Wed May 31 10:21:22 US/Eastern 2000
Subject: Cosmic Radiation Effects on Components
Message:
Have there been any studies or analyses on the effects of cosmic radiation on electronic components being flown at altitude? I have a system that will be flown between 45K & 50K feet comprising COTS/NDI equipment. I am particularly interested in processor and memory devices. However, any information with respect to cosmic radiation exposure and the effects on life expectancy or reliability would be appreciated.


Reply:

Subject: Cosmic Radiation Effects on Components
Reply Posted by: Jack Farrell (jfarrell@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Fri Jun 2 15:27:20 US/Eastern 2000
Message:
A paper was presented at the 2000 IEEE International Reliability Physics Symposium (38th) entitled “Neutron-Induced Boron Fission as a Major Source of Soft Errors in Deep Submicron SRAM Devices” by TI, which discussed radiation testing of modern high-density low voltage memories. In addition, a number of references covering cosmic ray and alpha-particle effects on IC’s were provided. IEEE can be contacted via their web site at .


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