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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Johnson Wood (7815@notesmail.huawei.com.cn )
Organization:Shenzhen Huawei.Tech.Co.,Ltd.
Date posted: Mon Jun 5 3:25:40 US/Eastern 2000
Subject: Reliability Data Source
Message:
There are two kinds of data source for component failure rates.One is 217 or other reliability prediction manual, another is the manufacturers' data. But I think they're quite different. The data in 217 are generated by statistics of field operation information.But failure rates provided by manufacturers are generally derived from reliability tests. During these tests, the components are not in an operating condition. So these data can not represent the components' reliability in operating condition. Am I right?


Reply:

Subject: Vendor Test Data
Reply Posted by: Jack Farrell (jfarrell@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Wed Jun 7 10:41:24 US/Eastern 2000
Message:
Plastic Encapsulated Microcircuit (PEM) manufacturers typically perform accelerated stress tests such as HAST, 85/85, autoclave, life test and high temperature, which may or may not be operating. The purpose of these tests is to evaluate the effects of years of field use on devices, in days in the lab. Failure data collected from field operation has shown that the majorities of failures are package, rather than die, related and can be correlated to lab testing results. The Reliability Analysis Center has developed failure rate models, RACRates, which are partly based on this lab test data. RACRates have been automated in RACís system reliability prediction tool PRISM .


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