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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Jim Neil
Date posted: Wed Jun 14 18:30:06 US/Eastern 2000
Subject: Failure rate
Message:
What're the typical FITS for Si FET, Bipolar, and Diodes? Thanks. Jim


Reply:

Subject: Device Failure Rate Calculation
Reply Posted by: Jack Farrell (jfarrell@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Mon Jun 19 13:58:39 US/Eastern 2000
Message:
Your question cannot be properly answered based on the information provided. Knowing the device type is not sufficient to determine a devices failure rate. Additional information concerning device quality level, use environment, and in-circuit stresses is required. The RAC has a reliability prediction tool PRISM that can be used to predict the failure rate for a device. Information and a downloadable demo for PRISM can be found at .


Reply:

Subject: Failure Rates for FETS in the Prism Demo
Reply Posted by: Alan H. Stolpen (stolpen_alan@si.com )Smiths Industries
Date Posted: Wed Jul 5 12:58:40 US/Eastern 2000
Message:
To Jack Farrell: Jack, you suggested looking at the Prism demo as a response to a question on FITS for Si FETs, Bipolars and Diodes. Our copy of the demo doesn't seem to address FETs. Are we missing something? The analysis of Si FETS is one of the main reasons for trying the demo and hopefully the full program, if our review is successful. PS: There seems to be a question on Library installation for Windows 95 (our case). Could the lack of FET analysis because of that, or isn't it addressed in the demo? -Alan


Reply:

Subject: PRISM FET Model
Reply Posted by: Jack Farrell (jfarrell@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Wed Jul 5 14:27:53 US/Eastern 2000
Message:
The Tutorial Example System that is provided with the PRISM Demo does not include FETs. If you wish to develop a failure rate for a FET highlight an assembly from the Tutorial Example System (this is done by positioning the cursor over an assembly and clicking the left mouse button). With the assembly highlighted click the right mouse button and choose "Add Component" from the pop-up menu. Now left-click on the "Lookup" button found in the upper right of the screen. In the box "Index Term" of the window that pops-up type "transistor" and then select the appropriate device from the box below. Using the tabs on the right half of the screen you may now further refine the failure rate model.


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