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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Jim Neil
Date posted: Wed Jun 14 18:30:06 US/Eastern 2000
Subject: Failure rate
Message:
What're the typical FITS for Si FET, Bipolar, and Diodes? Thanks. Jim


Reply:

Subject: Device Failure Rate Calculation
Reply Posted by: Jack Farrell (jfarrell@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Mon Jun 19 13:58:39 US/Eastern 2000
Message:
Your question cannot be properly answered based on the information provided. Knowing the device type is not sufficient to determine a devices failure rate. Additional information concerning device quality level, use environment, and in-circuit stresses is required. The RAC has a reliability prediction tool PRISM that can be used to predict the failure rate for a device. Information and a downloadable demo for PRISM can be found at .


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