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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum ( )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: gembong b. ( )
Date posted: Thu Feb 15 10:39:28 US/Eastern 2001
Subject: MEOST
I'm looking for a bit detailed guideline and or explanation the so called MEOST (Multiple Environment Overstress Test) Pls advice me if somebody know. gembong


Subject: Multiple Environment Overstress Testing
Reply Posted by: Bruce Dudley ( )
Organization: Reliability Analysis Center
Date Posted: Mon Feb 19 11:10:31 US/Eastern 2001
Multi-level accelerated life tests (ALTs) MEOST (multiple extreme overstress testing) and traditional step-stress approaches have a number of worth while applications for the analysis of the projected reliability of components and systems. These test methods are considered for many common situations of accelerated life testing (ALT). Some of the main purposes of ALT are to measure projected system life and to identify product weakness in order to improve reliability. These methods may apply well when only a small number of systems are available, when extremely long, specialized test equipment is required, when limited environmental chamber capability and/or test fixtures are involved and, lastly, when very expensive support equipment represents a serious test limit. Previous accelerated testing methods have had some limited applications in the past. The limits have been sometimes due to poorly described degradation or accumulative fatique & the subsequent difficulty with the analysis of the failure data themselves. A tight series of ground rule methods to improve the analysis of these multi-level stress tests is necessary. Methods for calculating test parameters are discussed in a paper by James A. Mclinn called Ways to Improve the Analysis of Multi-Level Accelerated Testing. This paper is published in the Quality and Reliability Engineering International,Novemmber/December 1998, volume 14 number 6.

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