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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum ( )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Posted by: Barry Moon ( )
Organization:BAE SYSTEMS
Date posted: Thu Nov 8 7:28:09 US/Eastern 2001
Subject: Reliability degradation due to static damage
Does any data exist which may indicate the degree of that may occur when electronic components are exposed to static damage i.e. the reliability is typically reduced by 50%.


Subject: Electrostatic Overstress
Reply Posted by: B.W.Dudley ( )
Organization: Reliability Analysis Center
Date Posted: Thu Nov 8 13:54:22 US/Eastern 2001
Data exists that shows which part types are susceptible to electrostatic overstress. I reviewed both the RAC Failure Mode/Mechanism Distribution guide and the RAC Electronic Derating guide and found that the electronic parts that are susceptible are: diodes, microcircuits, transistors and thermistors. The relative range of electrostatic overstress that each has shown is: Diodes -- 8 to 30% relative failure mode probability Microcircuits -- 6 to 35% relative failure mode probability Transistors -- 5 to 18% relative failure mode probability Thermistors -- 16% relative failure mode probability None of these devices have the percent that you have quoted, that is, 50%. Copies of the reference guides are available from the RAC product catalog at .

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