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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Barry Moon (barry.moon@baesystems.com )
Organization:BAE SYSTEMS
Date posted: Thu Nov 8 7:28:09 US/Eastern 2001
Subject: Reliability degradation due to static damage
Message:
Does any data exist which may indicate the degree of that may occur when electronic components are exposed to static damage i.e. the reliability is typically reduced by 50%.


Reply:

Subject: Electrostatic Overstress
Reply Posted by: B.W.Dudley (bdudley@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Thu Nov 8 13:54:22 US/Eastern 2001
Message:
Data exists that shows which part types are susceptible to electrostatic overstress. I reviewed both the RAC Failure Mode/Mechanism Distribution guide and the RAC Electronic Derating guide and found that the electronic parts that are susceptible are: diodes, microcircuits, transistors and thermistors. The relative range of electrostatic overstress that each has shown is: Diodes -- 8 to 30% relative failure mode probability Microcircuits -- 6 to 35% relative failure mode probability Transistors -- 5 to 18% relative failure mode probability Thermistors -- 16% relative failure mode probability None of these devices have the percent that you have quoted, that is, 50%. Copies of the reference guides are available from the RAC product catalog at http://rac.alionscience.com .


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