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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Richard Smith (atari_400@hotmail.com )
Date posted: Mon Jan 7 15:00:26 US/Eastern 2002
Subject: Reliability Testing Comparison (RDGT/HALT/HASS/PRAT etc.)
Message:
Does anybody know of a website or reference that discusses or compares the benefits or disadvantages of the following types of reliability testing: - Reliability Development Growth Testing (RDGT) - HALT/HASS (Highly Accelerated Life Test/Highly Accelerated Stress Screening) - Production Reliability Acceptance Testing (PRAT) - etc. What I am looking for is something that would help decide when one method would be more advantageous or cost effective over another, and would possibly yield meaningful results.


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Reply:

Subject: HALT and HASS
Reply Posted by: Kirk Gray (k.a.gray@ieee.org )
Organization: AcceleRel Engineering
Date Posted: Fri Feb 8 16:00:11 US/Eastern 2002
Message:
Gary is correct about the process of HALT and HASS. But It is a major change in perspective and philosophy of reliability testing of electronic hardware. It does save cost overall in its ability to rapidly illuminate flaws and weakness. These defects are the main cause of failures of electronics. For most applications, the inherent "life" of defect free electronics far exceeds the technological usefullness lifetimes by decades. The most efficient testing occurs when you are testing based on material strengths, not trying to quantify "lifetimes". Electronics are inherently robust and the main reason there are field failures is because of special cause defects in design, manufacture, and not because they are "worn-out".


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