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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by:Al Johnson (al.johnson@hs.utc.com )
Organization:HS Missile, Space & Undersea
Date posted: Fri Mar 22 10:43:02 US/Eastern 2002
Subject: Aging mechanism on electronic components
Message:
Could anyone direct me to published papers on the failure mechanisms for aging electronic components? The concern is for failure predictability of electronic components in a defensive missile system stored in a canister environment for ten plus years.


Reply:

Subject: Aging Mechanisms
Reply Posted by: Bruce Dudley (bdudley@alionscience.com )
Organization: RAC
Date Posted: Wed Mar 27 14:26:04 US/Eastern 2002
Message:
Establishing failure modes and mechanisms for electronic components can be developed from the RAC "Failure Mode / Mechanism (FMD-97)" report or the RAC "Electronic Derating for Optimum Performance (D-RATE)" report. These mechanisms in these reports are not solely related to dormant or end of life conditions as they cover the entire life considerations for both operating and non-operating.. So, I would recommend that you also consult with the book "Long-Term Non-Operating Reliability of Electronic Products" by Judy and Michael Pecht, CRC Press, ISBN 0-8493-9621-2 to establish some of the dormant or storage conditions that effect the electronic components.


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