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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Uma
Date posted: Tue Aug 20 14:42:14 US/Eastern 2002
Subject: How to handle inductors, oscillators and connectors in PRISM
Message:
I have been using MIL-HDBK-217FN2 and Telcordia/Bellcore SR-332 for my reliability analysis. I have part types such as inductors, oscillators, filters, connectors etc in my product. How do I use PRISM to perform reliability analysis? RACRate models are not available for these part types. Why? Will they be available in the near future?


Reply:

Subject: How to handle inductors, oscillators and connectors in PRISM
Reply Posted by: David Dylis (ddylis@alionscience.com )
Organization: Reliability Analysis Center (RAC)
Date Posted: Tue Aug 20 15:26:39 US/Eastern 2002
Message:
Currently, PRISM incorporates failure rate prediction models for integrated circuits, transistors, diodes, capacitors, resistors, thyristors and software. An extensive database of failure rate data is provided within the PRISM tool to assess the failure rates of components where PRISM failure rate prediction models do not exist. Additionally, a PRISM user has the ability to incorporate a user defined failure rate into a PRISM analysis. This user defined failure rate could be derived from available field/test data or from another prediction methodology such as you have mentioned. The RAC is in the process of collecting field reliability data on components and systems. It is anticipated that this data will be used to update current PRISM prediction models and to develop models for component part types currently not included in PRISM. If your organization has reliability data that could aid us in this process, feel free to contact me.

David Dylis
RAC Data and Information Manager
ddylis@alionscience.com


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