SRC Forum - Message Replies
Forum: Reliability & Maintainability Questions and AnswersTopic: Reliability & Maintainability Questions and Answers
Topic Posted by: Reliability & Maintainability Forum
(src_forum@alionscience.com
)
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998
Original Message:
Posted by: Ray Moran
(ray.moran@otis.com
)
Organization:Otis Elevator
Date posted: Mon Sep 23 15:44:10 US/Eastern 2002
Subject: Flash data retention
Message:
Can anyone direct me to some technical papers which characterize flash memory data retention as a function of both time and temperature? Thanks.
Reply:
William H. Crowell
Subject: Flash Memory Data Retention
Reply Posted by: (wcrowell@alionscience.com
)
Organization: Reliability Analysis Center (RAC)
Date Posted: Fri Sep 27 10:49:12 US/Eastern 2002
Message:
The following documents are the result of several searches I ran using RAC's technical library and also using the Google search engine.
http://www.intel.com/research/silicon/OUM_doc.pdf
http://www.m-sys.com/files/articles/FFD_MilTech0702.PDF
http://www.embedded-control-europe.com/pdf/ECEJun02p34.pdf
http://www.mosaicsemi.com/pub/qa_reports/2f16006.pdf
http://www.mosaicsemi.com/pub/app_notes/ANH012A.pdf
http://www.irps.org/past_pro/90chron.htm
90150 by: Rakkhit, R., Haddad, S., Chang, C., Yue, J., Advanced Micro Devices
Title: Drain-Avalanche Induced Hole Injection and Generation of Interface Traps in Thin Oxide MOS Devices
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