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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum ( )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Ray Moran ( )
Organization:Otis Elevator
Date posted: Mon Sep 23 15:44:10 US/Eastern 2002
Subject: Flash data retention
Can anyone direct me to some technical papers which characterize flash memory data retention as a function of both time and temperature? Thanks.


William H. Crowell Subject: Flash Memory Data Retention
Reply Posted by: ( )
Organization: Reliability Analysis Center (RAC)
Date Posted: Fri Sep 27 10:49:12 US/Eastern 2002
The following documents are the result of several searches I ran using RAC's technical library and also using the Google search engine.
90150 by: Rakkhit, R., Haddad, S., Chang, C., Yue, J., Advanced Micro Devices
Title: Drain-Avalanche Induced Hole Injection and Generation of Interface Traps in Thin Oxide MOS Devices

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