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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998
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Original Message:

Posted by: HENSENS (roland.hensens@etca.alcatel.be )
Organization:ALCATEL
Date posted: Thu Dec 12 8:07:21 US/Eastern 2002
Subject: ASIC FMECA - Main failure modes
Message:
I am searching information for doing an internal FMECA analysis of a digital ASIC in CMOS 0.6µm technology. What about the common approach for analysing the contribution of internal functions of an integrated circuit in failure rate ? Does anybody know if they are existing publications or research results highlighting the main internal failure modes observed in ASIC or integrated circuits during operation (as stuck-at-0 or stuck-at-1, supply short circuit, buffer output short cicuit,...) ? Is the main failure mode of the CMOS transistor predictable (open drain, short circuit or leakage drain-source,...) or random ? Is the short-circuit between positive/negative supply tracks (through interlayer oxide breakdown) a significant / predominant failure mode in current integrated circuits ? I thank you in advance for any help you could give in this way.

Reply:

Subject: Failure Modes
Reply Posted by: B.W.Dudley (bdudley@alionscience.com )
Organization: RAC
Date Posted: Fri Jan 24 11:09:36 US/Eastern 2003
Message:
Performing Failure Mode Analysis on the internal part of any microcircuit is a very difficult procedure as this data is difficult to obtain. The circuits and technology change rapidly so the failure mode information is always lagging. The basic failure modes that I could uncover for a gate array circuit, which may represent your CMOS application specific integrated circuit, include failure mode and percentages as follows: Degraded -- 25% Transistor failure -- 23% Shorted -- 19% Opened -- 17% Leakage -- 8% Misc. -- 8%

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