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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Ed
Date posted: Mon Jan 6 13:17:18 US/Eastern 2003
Subject: Wearout or random failure
Message:
The failure criteria of a device is 10% change in one parameter. Is it a wearout or random failure? Thanks.


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Subject: Again: Wearout or random failure
Reply Posted by: Ed
Date Posted: Tue Jan 7 15:26:08 US/Eastern 2003
Message:
The failure is degradation over time. So if it is the case, how to predict MTBF of a system which includes some this kind of device. 217 or Telcordia's prediction is based on constant failure rates, however the failure mechanism of a lot of electronic devices is parametric degradation. How to perform the MTBF? Thanks.


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