SRC Forum - Message Replies
Forum: Reliability & Maintainability Questions and Answers
Topic: Reliability & Maintainability Questions and Answers
Topic Posted by: Reliability & Maintainability Forum
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998
Posted by: Ed
Date posted: Mon Jan 6 13:17:18 US/Eastern 2003
Subject: Wearout or random failure
The failure criteria of a device is 10% change in one parameter. Is it a wearout or random failure? Thanks.
Subject: Again: Wearout or random failure
Reply Posted by: Ed
Date Posted: Tue Jan 7 15:26:08 US/Eastern 2003
The failure is degradation over time. So if it is the case, how to predict MTBF of a system which includes some this kind of device. 217 or Telcordia's prediction is based on constant failure rates, however the failure mechanism of a lot of electronic devices is parametric degradation. How to perform the MTBF? Thanks.