SRC Forum - Message Replies
Forum: Reliability & Maintainability Questions and AnswersTopic: Reliability & Maintainability Questions and Answers
Topic Posted by: Reliability & Maintainability Forum
(src_forum@alionscience.com
)
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998
Original Message:
Posted by: Lee Mathiesen
(lee@lansdale.com
)
Organization:Lansdale Semiconductor inc.
Date posted: Thu Jan 9 12:48:51 US/Eastern 2003
Subject: Technology difference vs. system reliability
Message:
I was wondering if anyone has done long term reliability studies of "gem" emulated microcircuits. what is the mtbf for a 1.5 micron BiCmos designed IC vs. a 4-7 micron bipolar IC. What other problems ie. ESDS, Radiation Tolerance, Metal migration etc,
Reply:
Subject: Reliability ICs
Reply Posted by: B.W.Dudley
(bdudley@alionscience.com
)
Organization: RAC
Date Posted: Mon Jan 27 14:51:06 US/Eastern 2003
Message:
Reliability of the two styles of microcircuits, that is 1.5 micron technology and 4 micron technology have a historical failure rate difference of about 7 or 8 times. The old four micron technology devices show failure rates of 28 fits [failures per billion hours] for nand technology where 1.5 micron devices have a failure rate of 4 fits. This information was developed via the RAC’s PRISM prediction process, which allows access to old time technology. Current sub-micron technology indicates that the failure rate is as low as 1.5 fits.
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