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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Dave Strobel (dstrobel@nxgenelect.com )
Organization:NxGen Electronics
Date posted: Mon Jan 27 14:00:14 US/Eastern 2003
Subject: FRAM reliability data
Message:
I am seeking recent reliability data on FRAM devices, from any supplier, Preferrably on 256Kbit density ICs.


Reply:

Subject: FRAM Reliability
Reply Posted by: B.W.Dudley (bdudley@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Mon Feb 17 14:10:02 US/Eastern 2003
Message:
FRAM or ferroelectric memory has been used in space application and is considered high reliability. It has high radiation resistance, virtually unlimited endurance, excellent retention over a wide temperature range and fast programming times. The fit failure rate for a 1K bit device from Matsushita testing is two fits at 27 degrees C and less than 100 at 70 degrees C.


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