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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Sathees kumar Ramamoorthy (satheeskr@ctd.hcltech.com )
Organization:HCL Technologies
Date posted: Tue Mar 4 13:32:41 US/Eastern 2003
Subject: Reg - MIL HDBK 217F
Message:
Dear all, MIL HDK 217F address for Memory chips upto 1M Bits size for calculation of Die Complexity Failure Rate(C1). we are using chips that are of 4 M Bits in size. Could we extrapolate the vaue from 1 M Bits or take the value for 1 M Bits.


Reply:

Subject: MIL-HDBK-217 Memories
Reply Posted by: BWD (bdudley@alionscience.com )
Organization: RAC
Date Posted: Tue Mar 4 15:51:36 US/Eastern 2003
Message:
Extrapolation of the models in MIL-HDBK-217 is considered a high risk venture. The data and the resulting models for MIL-HDBK-217 memory devices are over ten years old. This means that technology has by passed the factors in the handbook. I think that you will find that if you extrapolate the model, you will project failure rates that are greater than 100 fits. Test and operating data indicate that these devices could have reliability values less than 10 fits. A ten X factor could be a problem. I would suggest that you consider the use of PRISM as the prediction source since it has technology growth potential.


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