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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: TK Tan (tktan@ctlsg.creaf.com )
Organization:Creative
Date posted: Fri Jul 23 5:16:20 US/Eastern 1999
Subject: ESD Sensitivity
Message:
I find most IC data books state ESD testing using Mil-STD-883 Method 3015. HBM (2KV, 100pF, 1.5kohm, 10ns). Although production has ESD protection in place, but I'm interested to know the ESD sensitivity of various type of components at low humidity (during winter time ?% RH). 1) CMOS 2) TTL 3) JFET 4) power supply regulator 5) power amplifier 6) diode, bi-polar transistor 7) capacitor, inductor, resistor If there are no data available, please advise me realistically whether ESD protection is a must for these components type, especially for analog PCBA with just regulator, amplifier, non-chip components (diode, transistor, capcitor, resistor). Thanks.


Reply:

Subject: ESD Sensitivity Data
Reply Posted by: Seymour Morris (smorris@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Mon Jul 26 11:54:27 US/Eastern 1999
Message:
I recommend checking the RAC EOS/ESD Guidelines. Although we do not have ESD susceptibility data as a function of humidity there is susceptibility data tabulated and summarized for many device types. Data showing the percentage of devices failing versus ESD voltage for several devices you are interested in is as follows: CLASS 1 CLASS 2 CLASS 3 CMOS 75% 18.5% 6.5% TTL 43% 47.1% 9.9% JFET 68.7% 17.7% 13.6% Where: CLASS 1 sensitivity means the device is suseptable to voltages from 0 to 1999 volts CLASS 2 sensitivity means the device is suseptable to voltages from 2000 to 3999 volts CLASS 3 sensitivity means the device is suseptable to voltages from 4000 to 15999 volts Another reference that may provide useful data is the following: Methodology used for the development of an electrostatic discharge (ESD) sensitivity classification for packaging and handling of automotive components, Katrak, K.K., Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium


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