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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Mark EPstein (mark.i.epstein@baesystems.com )
Date posted: Tue May 6 10:39:50 US/Eastern 2003
Subject: RAC document PEM2, Reliable Application of Plastic Encapsulated Microcircuits
Message:
I am trying to find out if anybody has used or has some info on the PEM reliability prediction model in the RAC document PEM2, Reliable Application of Plastic Encapsulated Microcircuits. Supposedly there is a prediction model in this document that is based on current reliability data for PEMs. Is this the same model that is in PRISM.


Reply:

Subject: PEM2 and PRISM
Reply Posted by: David Dylis (ddylis@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Thu May 8 10:23:52 US/Eastern 2003
Message:
The PEM model contained in PRISM is based on the model contained in the orignal RAC publication "Reliabile Application of Plastic Encapsulated Microcircuits" (Order Code: PEM2). The PRISM PEM model takes into account new data that the RAC collected after development of the PEM2 model and also accounts for other factors not addressed in the PEM2 that include EOS/ESD and solder joint contributions. A copy of a paper discussing the PRISM methodology will be sent to you in a separate Email. You may also download a demo version of PRISM at http://rac.alionscience.com/prism. If you have any additional questions, feel free to contact me. D. David Dylis Data Operations Manager Reliability Analysis Center (RAC) 201 Mill Street Rome, NY 13440 Phone: (315) 339-7055 Fax: (315) 337-9932 Email: ddylis@alionscience.com


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