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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Bob Valerius (rvalerius@northropgrumman.com )
Organization:Northrop-Grumman Oceanic & Naval Systems
Date posted: Thu May 8 11:28:56 US/Eastern 2003
Subject: One-Shot Device Reliability Analysis
Message:
Hi, Is there any way to do an analysis or prediction on a one shot device? I realize that the binomial theoreum can be used to estimate reliability at a specified confidence level if you have test data. However, we are trying to build an undersea (depth = 1200 feet) cable cutter (has electronics and hydraulics) that sits for as many as 30 days and then is exercised. Thus multiple real life tests of this would be extremely long and expensive. Also, any ideas on how we could acclerate the test time? Thanks in advance. Bob Valerius


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Reply:

Subject: Binomial Analysis and Accelerated Testing
Reply Posted by: BWD (bdudley@alionscience.com )
Organization: RAC
Date Posted: Mon May 12 9:49:35 US/Eastern 2003
Message:
The RAC web site has a binomial estimation processes and accelerated testing information. This information is listed as part of the START information. The web address is: http://rac.alionscience.com/rac/jsp/start/startsheet.jsp


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