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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Bob Moore (bob.moore@bae.co.uk )
Organization:British Aerospace
Date posted: Wed Dec 23 5:24:48 US/Eastern 1998
Subject: HALT for potted modules
Message:
Does anyone have any experience of conducting Highly Accelerated Life Testing on potted modules or is this a complete waste of time? Any comments gratefully received. Please copy any reply to my email address as well as this forum as web access is infrequent. Bob Moore


Reply:

Bruce Dudley Subject: HALT for potted modules
Reply Posted by: (bdudley@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Wed Dec 23 13:25:51 US/Eastern 1998
Message:
Although we have not performed any HALT testing on potted modules, the test concept is applicable to these modules. HALT testing is a cumulative fatigue stress test using high stress levels of temperature cycling, vibration testing or both. The potted modules are typically not susceptible to vibration stresses, but often are susceptible to temperature cycling. The primary purpose of the HALT testing is to cause module or component failures, the next step is to find the root cause of the failures and then fix the deficiency. Potted modules are difficult items to perform root cause analysis on due to the potting compounds. The correction of the deficiency by a vendor may even be more difficult to attain unless there is a large order involved. If you are considering performing a screen, then ESS or HASS would be more applicable.


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