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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Joni Siipola
Date posted: Fri Jul 30 6:36:18 US/Eastern 1999
Subject: component derating
Message:
I noticed an interesting question and since the answers were not particularly helpful, I'd like to arise the question once more. "Does anyone have any new quantifiable data on the use of component parameter derating (thermal, power etc). I am used to the usual "margin of ignorance" type arguments, package glass transition temperatures and the junction/channel type Arrhenius relationships (generally with assumed activation energies). However, is there any more recent quantifiable data available to convince a sceptical design engineer and to what extent is derating used?" Thank you for your help!


Reply:

Subject: Latest Derating Study
Reply Posted by: Seymour Morris (smorris@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Mon Aug 2 13:02:10 US/Eastern 1999
Message:
One of the latest dedicated studies on derating was a research effort sponsored by the former U. S. Air Force Rome Laboratory in 1992. The technical report, RL-TR-92-11 (ADA253334), "Advanced Technology Component Derating", was published in 1992 and can be ordered from the National Technical Information Service (NTIS), Phone: 703-487-4650. I believe this is the latest dedicated study on the topic of derating.


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