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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum ( )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Posted by: Wee Teck Hoon ( )
Organization:DSO National Laboratories
Date posted: Thu Aug 12 3:21:01 US/Eastern 1999
Subject: SMART BIT
Have read the Final Technical Report on SMART BIT/TSMD Integration (RL-TR-91-353) and but could not find any follow-up on this issue. Would like to know whether SMART BIT technology has been field proven on avionics systems. Beside temperature and vibration, are there other stresses affecting intermittent failure in avionics system. Would like to know if there are any relevent data that relates environmental stresses to intermittent failures, which I can reference to. Thanks


Subject: Smart BIT
Reply Posted by: Bruce Dudley ( )
Organization: Reliability Analysis Center
Date Posted: Thu Aug 19 9:13:47 US/Eastern 1999
Follow-on work was performed on SMART-BIT by the Westinghouse Corp. as part of a Rome Laboratory effort. This project was called the "Intelligent Built-In Test and Stress Measurment" project. The final report is: RL-TR-95-43, March 1995. This project involved the design and development of an intelligent measurement system for a radar signal processor. All steps up to the installation of the intelligent system were accomplished, actual test data was not collected on the platform. Fault logging using micro Time Stress Measurment Devices (TSMD) has been proven successfull on the B-1B radar system. This part of the project demonstrated that temperature, humididty, voltage, and vibration stresses can be collected and analyzed to determine the actual stress levels applied to the equipment.

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