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Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Floyd Kreuze (floyd.kreuze@sgpmh.honeywell.com )
Organization:Honeywell SGP/MSPO
Date posted: Tue Oct 5 13:18:26 US/Eastern 1999
Subject: EEPROM Failure Model
Message:
I have some questions concerning the MIL-HDBK-217F Notice 2 failure rate model for EEPROM's (Page 5-4) What happens to A1 and A2 when the total number of programming cycles over EEPROM life goes over 500K? Is it possible that these tables are out of date and that EEPROM's rated at 1000K programming cycles (over life) are now being used reliably? What is there in the technical literature on this topic?


Reply:

Subject: EEPROM Data Retention
Reply Posted by: Seymour Morris (smorris@alionscience.com )
Organization: Reliability Analysis Center
Date Posted: Wed Oct 6 17:39:00 US/Eastern 1999
Message:
The tables you reference are out of date, as they are based on work published in the late 1980s time frame. I would not recommend extrapolation of the existing relationships since they may not be applicable to manufacturing process and design characteristics of EEPROMS in use today. Regarding recent technical literature published, I was able to find the following reference for your consideration: Limitations on oxide thicknesses in flash EEPROM Applications Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International on Pages: 93 - 99


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