Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum (src_forum@alionscience.com )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

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Original Message:

Posted by: Kevin
Date posted: Mon Sep 9 13:09:24 US/Eastern 2002
Subject: MOSFET Derating
Message:
We have a power MOSFET transistor (LDMOS), to be used in a ground benign environment, that we're derating from 200C to 150C. This FET can experience rapid changes in its output power and so will see significant thermal cycling. Is there any information on the reliability impact of thermal cycling on these devices and would this make us want to derate the device further? D-RATE doesn't seem to address this.

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