Forum: Reliability & Maintainability Questions and Answers

Topic: Reliability & Maintainability Questions and Answers

Topic Posted by: Reliability & Maintainability Forum ( )
Organization: System Reliability Center
Date Posted: Mon Aug 31 12:47:36 US/Eastern 1998

Topics List About this forum

Original Message:

Posted by: John S. Hoegbraathen ( )
Organization:Kongsberg Defence & Aerospace
Date posted: Wed Jul 14 7:00:11 US/Eastern 1999
Subject: Dudding of EEDīs
I am a system safety/reliability engineer working in an AEROSPACE company. I am looking into the possibility of including a bridgewire conductivity test for some of the EEDīs (Electro Explosive Device) in a new system which is currently under development. This test will perhaps be a part of a built in test. The proposed test current is 1 - 2 mA over a 10 to 100 msec interval. The EED tested will all be of 1A/1W type (hot bridgewire devices), pr MIL-I-23659C. Could this testing lead to dudding (fails to operate when called upon) of the EEDīs if the test is frequently used? What are the test limitations concerning the possibility of dudding? Are there anyone who could answer these questions or direct me to relevant l


Required Information:

Your Name:

Your Email Address:


Optional Information:


Your Organization's Web Site:

Your Web home page:


Formatting options for message:

Preformatted Text
Translated Text